Fully automated, sequential focused ion beam milling for cryo-electron tomography

Journal: eLife

Published: 2020-03-09

DOI: 10.7554/elife.52286

Affiliations: 4

Authors: 7

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Institutions Share
Department of Biology (D-BIOL), ETH Zurich, Switzerland 0.57
Institute of Molecular Biology and Biophysics, ETH Zurich, Switzerland 0.14
Carl Zeiss Microscopy GmbH, Germany 0.14
Institute of Biochemistry (IBC), ETH Zurich, Switzerland 0.14