Probing the Electronic Structure of Warm Dense Nickel via Resonant Inelastic X-Ray Scattering

Journal: Physical Review Letters

Published: 2020-11-04

DOI: 10.1103/physrevlett.125.195001

Affiliations: 3

Authors: 11

Go to article
Institutions Share
Oxford Clarendon Laboratory, United Kingdom (UK) 0.64
Stanford Linac Coherent Light Source (LCLS), United States of America (USA) 0.27
University of Toronto (U of T), Canada 0.09

Return