Approaching Quantum-Limited Metrology with Imperfect Detectors by Using Weak-Value Amplification

Journal: Physical Review Letters

Published: 2020-08-17

DOI: 10.1103/physrevlett.125.080501

Affiliations: 4

Authors: 7

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Institutions Share
National Laboratory of Solid State Microstructures (NLSSM), NJU, China 0.29
MOE Key Laboratory of Intelligent Optical Sensing and Manipulation, NJU, China 0.29
Warwick Department of Physics, United Kingdom (UK) 0.29
Max Planck-University of Ottawa Center for Extreme and Quantum Photonics, Canada 0.14

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