Thermal expansion characterization of thin films using harmonic Joule heating combined with atomic force microscopy

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0049160
Affiliations:
9
Authors:
12
Institutions Authors Share
Stanford University, United States of America (USA)
4.000000
0.33
Korea Basic Science Institute (KBSI), South Korea
2.000000
0.17
Sookmyung Women's University, South Korea
2.000000
0.17
The University of Tokyo (UTokyo), Japan
1.000000
0.08
Korea Institute of Science and Technology (KIST), South Korea
1.000000
0.08
Columbia University in the City of New York (CU), United States of America (USA)
1.000000
0.08
Chonnam National University, South Korea
1.000000
0.08