Mapping current profiles of point-contacted graphene devices using single-spin scanning magnetometer

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0037899
Affiliations:
5
Authors:
10
Institutions Authors Share
Korea University, South Korea
4.500000
0.45
Pohang University of Science and Technology (POSTECH), South Korea
3.000000
0.30
WPI International Center for Materials Nanoarchitectonics (WPI-MANA), NIMS, Japan
1.000000
0.10
Research Center for Functional Materials (RCFM), NIMS, Japan
1.000000
0.10
KU-KIST Graduate School of Converging Science and Technology, South Korea
0.500000
0.05