Ellipsometric study of the electronic behaviors of titanium-vanadium dioxide (TixV1−xO2) films for 0 ≤ x ≤ 1 during semiconductive-to-metallic phase transition

Journal:
Applied Physics Letters
Published:
DOI:
10.1063/5.0029279
Affiliations:
2
Authors:
4
Institutions Authors Share
Department of Materials and Chemistry (DMC), AIST, Japan
3.000000
0.75
Research Base Chugoku, AIST, Japan
1.000000
0.25