Study of dislocations in AlN single-crystal using bright-field synchrotron x-ray topography under a multiple-beam diffraction condition

Journal: Applied Physics Letters

Published: 2020-09-01

DOI: 10.1063/5.0015108

Affiliations: 4

Authors: 8

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Institutions Share
Japan Fine Ceramics Center (JFCC), Japan 0.38
University of Hyogo, Japan 0.38
Yamaguchi University, Japan 0.25

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