Express determination of thickness and dielectric function of single-walled carbon nanotube films

Journal: Applied Physics Letters

Published: 2020-06-09

DOI: 10.1063/5.0012933

Affiliations: 5

Authors: 6

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Institutions Share
Skolkovo Institute of Science and Technology (Skoltech), Russia 0.42
Moscow Institute of Physics and Technology - State University (MIPT), Russia 0.17
Aalto University, Finland 0.17
Canatu Oy, Finland 0.17
GrapheneTek LLC, Russia 0.08

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