Evidence of 2D intersubband scattering in thin film fully depleted silicon-on-insulator transistors operating at 4.2 K

Journal: Applied Physics Letters

Published: 2020-06-15

DOI: 10.1063/5.0007100

Affiliations: 5

Authors: 11

Go to article
Institutions Share
MINATEC, France 0.55
STMicroelectronics France, France 0.27
Institut de Microélectronique, Electromagnétisme et Photonique-Laboratoire d'Hyperfréquence et Caractérisation (IMEP-LAHC), France 0.09
Institut Néel, France 0.09

Return