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Hydrogen behavior under X-ray irradiation for a-IGZO thin film transistors

Journal: Applied Physics Letters

Published: 2020-01-02

DOI: 10.1063/1.5132372

Affiliations: 3

Authors: 6

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Institutions Share
Division of Materials Science and Engineering, HYU, South Korea 0.50
LG Display, South Korea 0.33
WizOptics Co., Ltd., South Korea 0.17