Notice

The database server is currently not answering requests properly. Some pages are still available due to caching. We are investigating the situation and will keep you updated.

Hydrogen behavior under X-ray irradiation for a-IGZO thin film transistors

Journal: Applied Physics Letters

Published: 2020-01-02

DOI: 10.1063/1.5132372

Affiliations: 3

Authors: 6

Go to article
Institutions Share
Division of Materials Science and Engineering, HYU, South Korea 0.50
LG Display, South Korea 0.33
WizOptics Co., Ltd., South Korea 0.17

Return