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Resolution enhancement of fluorescence microscopy using encoded patterns from all-dielectric metasurfaces

Journal: Applied Physics Letters

Published: 2019-09-03

DOI: 10.1063/1.5119006

Affiliations: 2

Authors: 5

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Institutions Share
Department of Mechanical Engineering, POSTECH, South Korea 0.90
Department of Chemical Engineering, POSTECH, South Korea 0.10

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