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Transient dielectric functions of Ge, Si, and InP from femtosecond pump-probe ellipsometry

Journal: Applied Physics Letters

Published: 2019-08-01

DOI: 10.1063/1.5109927

Affiliations: 5

Authors: 7

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Institutions Share
Institute of Physics (FZU), CAS, Czech Republic 0.50
Felix Bloch Institute for Solid State Physics, Leipzig University, Germany 0.36
Chalmers Department of Physics, Sweden 0.07
Department of Physics, NMSU, United States of America (USA) 0.07