Notice

The database server is currently not answering requests properly. Some pages are still available due to caching. We are investigating the situation and will keep you updated.

Transient dielectric functions of Ge, Si, and InP from femtosecond pump-probe ellipsometry

Journal: Applied Physics Letters

Published: 2019-08-01

DOI: 10.1063/1.5109927

Affiliations: 5

Authors: 7

Go to article
Institutions Share
Institute of Physics (FZU), CAS, Czech Republic 0.50
Felix Bloch Institute for Solid State Physics, Leipzig University, Germany 0.36
Chalmers Department of Physics, Sweden 0.07
Department of Physics, NMSU, United States of America (USA) 0.07

Return