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Fast raster scan multiplexed charge stability measurements toward high-throughput quantum dot array calibration

Journal: Applied Physics Letters

Published: 2019-06-19

DOI: 10.1063/1.5093685

Affiliations: 3

Authors: 9

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Institutions Share
Institute of Applied Physics (IAP), SNU, South Korea 0.56
Department of Physics, PNU, South Korea 0.33
The Joseph and Belle Braun Center for Submicron Research (SMC), WIS, Israel 0.11

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