On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy

Journal: Applied Physics Letters

Published: 2018-04-20

DOI: 10.1063/1.5016306

Affiliations: 3

Authors: 4

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Institutions FC
Department of Precision and Microsystems Engineering (PME), TU Delft, Netherlands 0.63
Netherlands Organisation for Applied Scientific Research (TNO), Netherlands 0.25
Department of Mechanical Engineering, TU/e, Netherlands 0.13

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