Memristor crossbar arrays with 6-nm half-pitch and 2-nm critical dimension

Journal: Nature Nanotechnology

Published: 2018-11-12

DOI: 10.1038/s41565-018-0302-0

Affiliations: 2

Authors: 7

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Institutions FC
Department of Electrical and Computer Engineering (ECE), UMass Amherst, United States of America (USA) 0.71
Center for Functional Nanomaterials (CFN), BNL, United States of America (USA) 0.29

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