Identifying Defect-Induced Trion in Monolayer WS2 via Carrier Screening Engineering

Journal:
ACS Nano
Published:
DOI:
10.1021/acsnano.0c08828
Affiliations:
6
Authors:
5
Institutions Authors Share
Center for Integrated Nanostructure Physics (CINAP), IBS, South Korea
2.500000
0.50
Sungkyunkwan University (SKKU), South Korea
2.500000
0.50