Measuring Three-Dimensional Strain and Structural Defects in a Single InGaAs Nanowire Using Coherent X-ray Multiangle Bragg Projection Ptychography

Journal: Nano Letters

Published: 2018-02-14

DOI: 10.1021/acs.nanolett.7b04024

Affiliations: 7

Authors: 16

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Institutions FC
National Synchrotron Light Source II (NSLS-II), BNL, United States of America (USA) 0.25
Materials Science Division (MSD), ANL, United States of America (USA) 0.25
Department of Materials Science and Engineering, NU, United States of America (USA) 0.19
Fresnel Institute, France 0.13
Center for Nanoscale Materials (CNM), ANL, United States of America (USA) 0.06
TUM Walter Schottky Institut (WSI), Germany 0.06
TUM Department of Physics, Germany 0.06