Determining the Dielectric Tensor of Microtextured Organic Thin Films by Imaging Mueller Matrix Ellipsometry

Journal: The Journal of Physical Chemistry Letters

Published: 2021-03-19

DOI: 10.1021/acs.jpclett.1c00317

Affiliations: 4

Authors: 6

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Institutions Share
Accurion GmbH, Germany 0.50
University of Southern Denmark (SDU), Denmark 0.17
Johannes Kepler University of Linz (JKU), Austria 0.17
University of Oldenburg, Germany 0.17

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