Analytical Approach to Screen Semiconducting MOFs Using Bloch Mode Analysis and Spectroscopic Measurements

Journal: The Journal of Physical Chemistry Letters

Published: 2021-01-12

DOI: 10.1021/acs.jpclett.0c03401

Affiliations: 1

Authors: 5

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Joint School of Nanoscience and Nanoengineering (JSNN), United States of America (USA) 1

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