Evaluation of the Defect Cluster Content in Singly and Doubly Doped Ceria through In Situ High-Pressure X-ray Diffraction

Journal:
Inorganic Chemistry
Published:
DOI:
10.1021/acs.inorgchem.1c00433
Affiliations:
5
Authors:
5
Institutions Authors Share
University of Genova, Italy
2.500000
0.50
Elettra - Sincrotrone Trieste S.C.p.A., Italy
1.000000
0.20
Institute of Condensed Matter Chemistry and Technologies for Energy (ICMATE), CNR, Italy
0.500000
0.10
INSTM - University of Genoa Research Unit (UdR Genoa), Italy
0.500000
0.10
Institute of Superconductors, Oxides and other Innovative Materials and Devices (SPIN), CNR, Italy
0.500000
0.10