Terahertz Time of Flight Spectroscopy as a Coating Thickness Reference Method for Partial Least Squares Near Infrared Spectroscopy Models

Journal: Analytical Chemistry

Published: 2020-02-05

DOI: 10.1021/acs.analchem.9b04750

Affiliations: 4

Authors: 8

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Institutions Share
Mylan School of Pharmacy, Duquesne University, United States of America (USA) 0.38
Graduate School of Pharmaceutical Sciences, Duquesne University, United States of America (USA) 0.38
Towa Pharmaceutical Co., Ltd., Japan 0.13
Advantest Laboratories Ltd., Japan 0.13

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