Numerical Simulations and In Situ Optical Microscopy Connecting Flow Pattern, Crystallization, and Thin‐Film Properties for Organic Transistors with Superior Device‐to‐Device Uniformity

Journal:
Advanced Materials
Published:
DOI:
10.1002/adma.202004864
Affiliations:
3
Authors:
6
Institutions Authors Share
Korea Advanced Institute of Science and Technology (KAIST), South Korea
3.000000
0.50
Seoul National University (SNU), South Korea
2.000000
0.33
Sungkyunkwan University (SKKU), South Korea
1.000000
0.17